Trinity College Dublin the University of Dublin_336DublinTED
High-Resolution Slide Scanning Microscope System
A High-Resolution Slide Scanning Microscope System to enable efficient, high throughput, high-quality microscopy images for stained slides, allowing image digitisation and easy integration to third-party software.
Type: Tender
Laboratory Instruments
Unlock documents for free
No credit card · Instant access
Content at a glance
- Tender type:
- Tender
- Contracting authority:
- Trinity College Dublin the University of Dublin_336
- Published:
- August 31, 2026
- Deadline:
- Not specified
- Topic:
- Laboratory Instruments
Tender description
A High-Resolution Slide Scanning Microscope System to enable efficient, high throughput, high-quality microscopy images for stained slides, allowing image digitisation and easy integration to third-party software.
Further details
With free access, documents, deadlines and submission notes are available in a structured format.
- Core requirements of the tender prioritized and prepared
- Deadlines, eligibility criteria and documents in one workflow
- Guidance for structured bid preparation
- Automatically discover matching follow-up tenders
Unlock 30 days free
30 days free · no credit card · cancel anytime
All procurement details
Buyer, lots, participants, locations, documents, and procedure data have already been captured. Open any area to see the complete information in your workspace.
7 data areas available
Unlock 30 days free
30 days free · no credit card · cancel anytime
Documents
Unlock50 details capturedDocuments · Document bundle
Buyer
Unlock3 details capturedBuyer · Address · Contact
Lots
Unlock1 detail capturedLots LOT-0001
Procedure data
Unlock5 details capturedPublication number · Procedure reference · Procedure type · Contract type · +1 more
Performance locations
Unlock3 details capturedPerformance locations
Bidders and contractors
Unlock3 details capturedBidders and contractors · Address · Contact
Publisher
Unlock3 details capturedPublisher · Address · Contact
Related tenders
5High-resolution field emission scanning electron microscope
Aalto University Foundation srAALTOHigh-resolution field emission scanning electron microscopeNano-indenter for dynamic nanoscale testing including continuous stiffness measurements, in-situ scanning probe microscopy, and high-speed mechanical microscopy
European Commission, DG GROW - Internal Market, Industry, Entrepreneurship and SMEsBrusselsThe nanoindentation system shall support the investigation of ion radiation induced damage and other degradation in metals, ceramics, claddings, protective coatings and thin films. The system shall enable high resolution nanoindentation using both quasi static and dynamic measurement techniques, in-situ scanning probe microscopy, and high-speed mechanical property mapping (i.e., mechanical microscopy), thereby allowing precise probing of damage gradients and other microstructural features.Supply of a Scanning Electrochemical Microscope
European Commission, DG GROW - Internal Market, Industry, Entrepreneurship and SMEsBrusselsDeadline: Oct 06The JRC Karlsruhe plans to sign a contract for a supply of a Scanning Electrochemical Microscope (SECM) to determine the nuclear fuel corrosion at micrometric scale under different conditions.High resolution nano-XCT system
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | IMWS vertreten durch: Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWSHalle (Saale)Deadline: Sep 04The Fraunhofer Institute for Microstructure of Materials and Systems IMWS researches the application behaviour, reliability, safety and lifetime of innovative materials in components and systems. The Business Unit “Electronic Materials and Components” Fraunhofer IMWS support industry and research partners by its internationally recognized expertise in failure analyses of electronic components. Fraunhofer IMWS will enhance its capabilities for advanced failure analysis and material characterization to support the ramp up of new heterogenous integration technologies addressing the manufacturing and reliability challenges. To enable the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localization in the package to enable further high-resolution physical diagnostics, the latest generation of radiography (2D) and X-ray tomography (3D-CT) systems are required in particular for the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localization in the package to enable further high-resolution physical diagnostics. A high-performance multi-processor workstation is required for postprocessing of the generated imaging data sets to identify tiny deviations and defects within the devices. This tender is for the supply a functional complete device including assembly, commissioning and all necessary connections, approvals/certifications and software for operation. The requirements for a state-of-the-art x-ray inspection tool for highly integrated 2.5/3D components are described below:High resolution X-ray inspection tool
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | IMWS vertreten durch: Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWSHalle (Saale)Deadline: Sep 04The Fraunhofer Institute for Microstructure of Materials and Systems IMWS researches the application behaviour, reliability, safety and lifetime of innovative materials in components and systems. The Business Unit “Electronic Materials and Components” Fraunhofer IMWS support industry and research partners by its internationally recognized expertise in failure analyses of electronic components. Fraunhofer IMWS will enhance its capabilities for advanced failure analysis and material characterization to support the ramp up of new heterogenous integration technologies addressing the manufacturing and reliability challenges. To enable the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localization in the package to enable further high-resolution physical diagnostics, the latest generation of radiography (2D) and X-ray tomography (3D-CT) systems are required in particular for the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localization in the package to enable further high-resolution physical diagnostics. A high-performance multi-processor workstation is required for postprocessing of the generated imaging data sets to identify tiny deviations and defects within the devices. This tender is for the supply a functional complete device including assembly, commissioning and all necessary connections, approvals/certifications and software for operation. The requirements for a state-of-the-art x-ray inspection tool for highly integrated 2.5/3D components are described below:
Frequently asked questions about this tender
- How can I apply for this tender?
- Create a free account on Auftrag One. You will then see all documents, deadlines and submission notes in a structured workflow.
- What is the submission deadline?
- No specific submission deadline is currently stated for this notice.
- Who is the contracting authority?
- The contracting authority is Trinity College Dublin the University of Dublin_336.
- Which documents are needed to get started?
- Typically you need the service description, proof of eligibility, deadline notes and possibly form sheets. On Auftrag One these items are displayed in prioritized order.