Aalto University Foundation srAALTOTED
High-resolution field emission scanning electron microscope
High-resolution field emission scanning electron microscope
Laboratory Instruments
No credit card · Instant access
Content at a glance
- Tender type:
- Tender
- Contracting authority:
- Aalto University Foundation sr
- Published:
- August 24, 2026
- Deadline:
- Not specified
- Topic:
- Laboratory Instruments
Tender description
High-resolution field emission scanning electron microscope
Further details
With free access, documents, deadlines and submission notes are available in a structured format.
- Core requirements of the tender prioritized and prepared
- Deadlines, eligibility criteria and documents in one workflow
- Guidance for structured bid preparation
- Automatically discover matching follow-up tenders
30 days free · no credit card · cancel anytime
All procurement details
Buyer, lots, participants, locations, documents, and procedure data have already been captured. Open any area to see the complete information in your workspace.
7 data areas available
30 days free · no credit card · cancel anytime
Documents
Unlock50 details capturedDocuments · Document bundle
Buyer
Unlock3 details capturedBuyer · Address · Contact
Lots
Unlock1 detail capturedLots LOT-0000
Procedure data
Unlock6 details capturedPublication number · Procedure reference · Buyer reference · Procedure type · +2 more
Performance locations
Unlock3 details capturedPerformance locations
Bidders and contractors
Unlock2 details capturedBidders and contractors · Address
Publisher
Unlock3 details capturedPublisher · Address · Contact
Related tenders
7High-Resolution Slide Scanning Microscope System
Trinity College Dublin the University of Dublin_336DublinA High-Resolution Slide Scanning Microscope System to enable efficient, high throughput, high-quality microscopy images for stained slides, allowing image digitisation and easy integration to third-party software.Transmission electron microscope
Kungliga Tekniska högskolanSTOCKHOLMKTH is seeking tenders for a 200 kV transmission electron microscope able to work in both transmission and scanning electron microscopy mode (S/TEM) with laser heating capability for sustainable metallurgy research.Procurement of Scanning Electron Microscope for Forsvarets laboratorietjenester (FOLAT) / Procurement of a Scanning Electron Microscope for The Norwegian Armed Forces Laboratory Services (FOLAT).
ForsvarsmateriellOSLODeadline: Oct 09The procurement consists of one procurement of goods and an annual service contract. The Norwegian Defence Laboratory Service (FOLAT) intends to procure a new Scanning Electron Microscope microscope microscope microscope for use in support of, among other things, "chip-warning" and damage/breakdown analyses on the Norwegian Armed Forces material systems within a wide range of assignments. In addition there is a need for an annual service contract for the material, including parts replacement. The extension of a service agreement beyond the material ́s expected lifetime (10 years) is included as a part of the contract.Scanning probe microscope
Aalto University Foundation srAALTODeadline: Sep 18Scanning probe microscope. For further information, see separate documents (as attachment files at the Tarjouspalvelu service at https://tarjouspalvelu.fi/aalto).Supply of a Scanning Electrochemical Microscope
European Commission, DG GROW - Internal Market, Industry, Entrepreneurship and SMEsBrusselsDeadline: Oct 06The JRC Karlsruhe plans to sign a contract for a supply of a Scanning Electrochemical Microscope (SECM) to determine the nuclear fuel corrosion at micrometric scale under different conditions.High resolution nano-XCT system
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | IMWS vertreten durch: Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWSHalle (Saale)Deadline: Sep 04The Fraunhofer Institute for Microstructure of Materials and Systems IMWS researches the application behaviour, reliability, safety and lifetime of innovative materials in components and systems. The Business Unit “Electronic Materials and Components” Fraunhofer IMWS support industry and research partners by its internationally recognized expertise in failure analyses of electronic components. Fraunhofer IMWS will enhance its capabilities for advanced failure analysis and material characterization to support the ramp up of new heterogenous integration technologies addressing the manufacturing and reliability challenges. To enable the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localization in the package to enable further high-resolution physical diagnostics, the latest generation of radiography (2D) and X-ray tomography (3D-CT) systems are required in particular for the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localization in the package to enable further high-resolution physical diagnostics. A high-performance multi-processor workstation is required for postprocessing of the generated imaging data sets to identify tiny deviations and defects within the devices. This tender is for the supply a functional complete device including assembly, commissioning and all necessary connections, approvals/certifications and software for operation. The requirements for a state-of-the-art x-ray inspection tool for highly integrated 2.5/3D components are described below:High resolution X-ray inspection tool
Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | IMWS vertreten durch: Fraunhofer-Institut für Mikrostruktur von Werkstoffen und Systemen IMWSHalle (Saale)Deadline: Sep 04The Fraunhofer Institute for Microstructure of Materials and Systems IMWS researches the application behaviour, reliability, safety and lifetime of innovative materials in components and systems. The Business Unit “Electronic Materials and Components” Fraunhofer IMWS support industry and research partners by its internationally recognized expertise in failure analyses of electronic components. Fraunhofer IMWS will enhance its capabilities for advanced failure analysis and material characterization to support the ramp up of new heterogenous integration technologies addressing the manufacturing and reliability challenges. To enable the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localization in the package to enable further high-resolution physical diagnostics, the latest generation of radiography (2D) and X-ray tomography (3D-CT) systems are required in particular for the non-destructive detection and evaluation of structural deviations, contact defects, damage characteristics and their most precise possible localization in the package to enable further high-resolution physical diagnostics. A high-performance multi-processor workstation is required for postprocessing of the generated imaging data sets to identify tiny deviations and defects within the devices. This tender is for the supply a functional complete device including assembly, commissioning and all necessary connections, approvals/certifications and software for operation. The requirements for a state-of-the-art x-ray inspection tool for highly integrated 2.5/3D components are described below:
Frequently asked questions about this tender
- How can I apply for this tender?
- Create a free account on Auftrag One. You will then see all documents, deadlines and submission notes in a structured workflow.
- What is the submission deadline?
- No specific submission deadline is currently stated for this notice.
- Who is the contracting authority?
- The contracting authority is Aalto University Foundation sr.
- Which documents are needed to get started?
- Typically you need the service description, proof of eligibility, deadline notes and possibly form sheets. On Auftrag One these items are displayed in prioritized order.