IHP GmbH - Leibniz-Institut für innovative MikroelektronikFrankfurt (Oder)TED
Semi Automatic Prober for characterization of 200 mm Wafers
Gegenstand der Beschaffung ist die Lieferung eines betriebsbereiten halbautomatischen Wafer-Probersystems mit integriertem Charakterisierungssystem. Das Gesamtsystem muss für DC-I/V-, C-V-, C-f-, C-t- sowie Niederfrequenz-Impedanzmessungen bis 10 MHz geeignet sein und als vollständig integrierte Einheit geliefert, installiert, in Betrieb ...
Measurement Technology, Laboratory Instruments
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Content at a glance
- Tender type:
- Tender
- Contracting authority:
- IHP GmbH - Leibniz-Institut für innovative Mikroelektronik
- Published:
- July 29, 2026
- Deadline:
- August 31, 2026
- Topic:
- Measurement Technology
Tender description
Gegenstand der Beschaffung ist die Lieferung eines betriebsbereiten halbautomatischen Wafer-Probersystems mit integriertem Charakterisierungssystem. Das Gesamtsystem muss für DC-I/V-, C-V-, C-f-, C-t- sowie Niederfrequenz-Impedanzmessungen bis 10 MHz geeignet sein und als vollständig integrierte Einheit geliefert, installiert, in Betrieb genommen und einschließlich einer Anwenderschulung übergeben werden. Sämtliche Schnittstellen zwischen den Systemkomponenten sind durch den Auftragnehmer sicherzustellen.
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- The submission deadline is 31. August 2026.
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- The contracting authority is IHP GmbH - Leibniz-Institut für innovative Mikroelektronik.
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