Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. - Einkauf B12 - Vergabestelle BauMünchenTED
SOC-Testsystem - PR1251693-2270-W
This specification describes the requirements for a semiconductor test system (mixed-signal test system) to be used for post-silicon verification, characterization and functional test of integrated circuits and chiplets at Fraunhofer EMFT. The test system must provide interfaces that allow connection with an industrial standard wafer prob...
Angebotsfrist: 07. September 2026 (abgelaufen)Typ: Ausschreibung
Messtechnik
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- Ausschreibungstyp:
- Ausschreibung
- Auftraggeber:
- Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. - Einkauf B12 - Vergabestelle Bau
- Veröffentlicht:
- 09. August 2026
- Frist:
- 07. September 2026
- Thema:
- Messtechnik
Ausschreibungsbeschreibung
This specification describes the requirements for a semiconductor test system (mixed-signal test system) to be used for post-silicon verification, characterization and functional test of integrated circuits and chiplets at Fraunhofer EMFT. The test system must provide interfaces that allow connection with an industrial standard wafer probing system as well as with an industrial standard device handling system. The test system has to be compatible in Hard- and Software to an already existing Advantest V93000 test system in the Fraunhofer-Gesellschaft.
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- Bis wann läuft die Angebotsfrist?
- Die Angebotsfrist endet am 07. September 2026.
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- Der Auftraggeber ist Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. - Einkauf B12 - Vergabestelle Bau.
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- In der Regel benötigen Sie Leistungsbeschreibung, Eignungsnachweise, Fristenhinweise und ggf. Formblätter. Auf Auftrag One werden diese Punkte priorisiert dargestellt.