Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. - Einkauf B12 - Vergabestelle BauMünchenTED
SOC Test System - PR1133981-2270-W
This specification describes the requirements for a semiconductor test system (mixed-signal test system) to be used for post-silicon verification, characterization and functional test of integrated circuits and chiplets at Fraunhofer EMFT. The test system must provide interfaces that allow connection with an industrial standard wafer prob...
Measurement Technology
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- Tender type:
- Tender
- Contracting authority:
- Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. - Einkauf B12 - Vergabestelle Bau
- Published:
- June 15, 2026
- Deadline:
- Not specified
- Topic:
- Measurement Technology
Tender description
This specification describes the requirements for a semiconductor test system (mixed-signal test system) to be used for post-silicon verification, characterization and functional test of integrated circuits and chiplets at Fraunhofer EMFT. The test system must provide interfaces that allow connection with an industrial standard wafer probing system as well as with an industrial standard device handling system. The test system has to be compatible in Hard- and Software to an already existing Advantest V93000 test system in the Fraunhofer-Gesellschaft. With Option 1: an extended warranty contract Option 2: a service contract Option 3: A maintanance support contract
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